Publications

Peer reviewed journal articles

  1. Control of quality factor of atomic force microscopy cantilever by cavity optomechanical effect
    Noah Austin-Bingamon, Binod D.C. and Yoichi Miyahara, Jpn. J. Appl. Phys. (2024).
  2. Slot-die coating of formamidinium-cesium mixed halide perovskites in ambient conditions with FAAc additive
    Nischal Khakurel, Drew Amyx, Maggie Yihong Chen, Yoichi Miyahara and Wilhelmus J. Geerts, MRS Commun. 14, 215-221 (2024).
  3. Electrostatic moiré potential from twisted hexagonal boron nitride layers
    Dong Seob Kim, Roy C. Dominguez, Rigo Mayorga-Luna, Dingyi Ye, Jacob Embley, Tixuan Tan, Yue Ni, Zhida Liu, Mitchell Ford, Frank Y. Gao, Saba Arash, Kenji Watanabe, Takashi Taniguchi, Suenne Kim, Chih-Kang Shih, Keji Lai, Wang Yao, Li Yang, Xiaoqin Li, and Yoichi Miyahara, Nature Materials 23, 65-70 (2024).
  4. Charge Carrier Inversion in a Doped Thin Film Organic Semiconductor Island, Zeno Schumacher, Rasa Rejali, Megan Cowie, Andreas Spielhofer, Yoichi Miyahara, and Peter Grutter, ACS Nano 15, 10377 (2021).
  5. Nanoscale force sensing of an ultrafast nonlinear optical response Zeno Schumacher, Rasa Rejali, Raphael Pachlatko, Andreas Spielhofer, Philipp Nagler, Yoichi Miyahara, David G Cooke, Peter Grütter, Proceedings of the National Academy of Sciences 117, 19773-19779 (2020).
  6. Optical excitation of atomic force microscopy cantilever for accurate spectroscopic measurements
    Yoichi Miyahara, Harrisonn Griffin, Antoine Roy-Gobeil, Ron Belyansky, Hadallia Bergeron, José Bustamante and Peter Grutter
    EPJ Techniques and Instrumentation 7, 2 (2020).
  7. An apparatus based on an atomic force microscope for implementing tip-controlled local breakdown
    T. St-Denis, K. Yazda, X. Capaldi, J. Bustamante, M. Safari, Y. Miyahara, Y. Zhang, P. Grutter and W. Reisner
    Rev. Sci. Instrum. 90, 123703 (2019).
  8. Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy
    Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro, Tyler Enright and Peter Grütter
    Sensors 19, 4510 (2019).
  9. Fully Quantized Electron Transfer Observed in a Single Redox Molecule at a Metal Interface
    Antoine Roy-Gobeil, Yoichi Miyahara, Kirk H. Bevan and Peter Grutter
    Nano Lett. 19, 6104-6108 (2019).
  10. Nanopore Formation via Tip-Controlled Local Breakdown Using an Atomic Force Microscope
    Yuning Zhang, Yoichi Miyahara, Nassim Derriche, Wayne Yang, Khadija Yazda, Xavier Capaldi, Zezhou Liu, Peter Grutter and Walter Reisner
    Small Methods 3, 1900147 (2019).
  11. Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements
    Aaron Mascaro, Yoichi Miyahara, Tyler Enright, Omur E. Dagdeviren and Peter Grutter
    Beilstein J. Nanotechnol. 10, 617 (2019).
  12. Eliminating the effect of acoustic noise on cantilever spring constant calibration
    Aaron Mascaro, Yoichi Miyahara, Omur E. Dagdeviren and Peter Grutter,
    Appl. Phys. Lett. 113, 233105 (2018).
  13. Energy Level Spectroscopy of Individual Quantum Dots by Electric Force Detection with Atomic force Microscopy (in Japanese)
    Yoichi Miyahara
    Vacuum and Surface Science (真空と表面) 61, 645 (2018).
  14. Relating Franck-Condon blockade to redox chemistry in the single-particle picture
    Kirk H. Bevan, Antoine Roy-Gobeil, Yoichi Miyahara and Peter Grutter
    J. Chem. Phys. 149, 104109 (2018).
  15. Influence of Environmentally Relevant Physicochemical Conditions on a Highly Efficient Inorganic Ice Nucleating Particle,
    Mainak Ganguly, Simon Dib, Uday Kurien, Rodrigo Benjamin Rangel-Alvarado, Yoichi Miyahara and Parisa A. Ariya
    J. Phys. Chem. C 122, 18690 (2018).
  16. Measuring spatially resolved collective ionic transport in lithium battery cathodes using atomic force microscopy
    Aaron Mascaro, Zi Wang, Pierre Hovington, Yoichi Miyahara, Andrea Paolella, Vincent Gariepy, Ziming Feng, Tyler Enright, Connor Aiken, Karim Zaghib, Kirk H. Bevan and Peter Grutter
    Nano Lett. 17, 4489-4496 (2017).
  17. Force-gradient sensitive Kelvin probe microscopy by dissipative electrostatic force modulation
    Yoichi Miyahara and Peter Grutter
    Appl. Phys. Lett. 110, 163103 (2017).
  18. The limit of time resolution in frequency modulation atomic force microscopy by a pump-probe approach
    Zeno Schumacher,  Andreas Spielhofer, Yoichi Miyahara and Peter Grutter
    Appl. Phys. Lett. 110, 053111 (2017).
  19. Quantum state readout of individual quantum dots by electrostatic force detection,
    Yoichi Miyahara, Antoine Roy-Gobeil and Peter Grutter
    Nanotechnology 28, 064001 (2017).
  20. Measurement of surface photovoltage by atomic force microscopy under pulsed illumination
    Zeno Schumacher, Yoichi Miyahara, Andreas Spielhofer and Peter Grutter
    Phys. Rev. Applied 5, 044018 (2016).
  21. Rapid mechanically controlled rewiring of neuronal circuits
    Margaret H. Magdesian, G. Monserratt Lopez-Ayon,  Megumi Mori,  Dominic Boudreau, Alexis Goulet-Hanssens, Ricardo Sanz, Yoichi Miyahara, Christopher J. Barrett, Alyson E. Fournier, Yves De Koninck and Peter Grutter
    J. Neurosci. 36, 979 (2016).
  22. Kelvin probe force microscopy by dissipative electrostatic force modulation
    Yoichi Miyahara, Jessica Topple, Zeno Schumacher and Peter Grutter
    Phys. Rev. Applied 4, 054011 (2015).
  23. Improved atomic force microscopy cantilever performance by partial reflective coating
    Zeno Schumacher, Yoichi Miyahara, Laure Aeschimann and Peter Grutter
    Beilstein J. Nanotech. 6, 1450 (2015).
  24. Revealing energy level structure of individual quantum dots by tunneling rate measured by single-electron sensitive electrostatic force spectroscopy
    Antoine Roy-Gobeil, Yoichi Miyahara, and Peter Grutter
    Nano Lett. 15, 2324 (2015).
  25. Scanning gate imaging of two coupled quantum dots in single-walled carbon nanotubes
    Xin Zhou, James Hedberg, Yoichi Miyahara, Peter Grutter and Koji Ishibashi
    Nanotechnology 25, 495703 (2014).
  26. FIM tips in SPM: Apex orientation and temperature considerations on atom transfer and diffusion
    William Paul, David Oliver, Yoichi Miyahara and Peter Grütter
    Appl. Surf. Sci. 305, 124 (2014).
  27. One-to-one spatially matched experiment and atomistic simulations of nanometre-scale indentation
    D. J. Oliver, W. Paul, M. El Ouali, T. Hagedorn, Y. Miyahara, Y. Qi and P. Grutter
    Nanotechnology 25, 025701 (2014).
  28. Transient adhesion and conductance phenomena in initial nanoscale mechanical contacts between dissimilar metals
    William Paul, David Oliver, Yoichi Miyahara and Peter Grütter
    Nanotechnology 24, 475704 (2013).
  29. Simple Si ( 111 ) surface preparation by thin wafer cleavage
    William Paul, Yoichi Miyahara and Peter Grutter
    J. Vac. Sci. Technol. A 31, 023201 (2013).
  30. Room-temperature single-electron charging detected by electrostatic force microscopy
    Antoni Tekiel, Yoichi Miyahara, Jessica M. Topple, and Peter Grutter
    ACS Nano 7, 4683 (2013).
  31. Minimum Threshold for Incipient Plasticity in the Atomic-Scale Nanoindentation of Au(111)
    William Paul, David Oliver, Yoichi Miyahara and Peter Grütter
    Phys. Rev. Lett. 110, 135506 (2013).
  32. Effect of using stencil masks made by focused ion beam milling on permalloy (Ni81Fe19) nanostructures
    J R Bates, Y Miyahara, J A J Burgess, Ó Iglesias-Freire and P Grütter
    Nanotechnology 24, 115301 (2013).
  33. Reactive growth of MgO overlayers on Fe(0 0 1) surfaces studied by low-energy electron diffraction and atomic force microscopy
    Antoni Tekiel, Shawn Fostner, Jessica Topple, Yoichi Miyahara and Peter Grütter
    Appl. Surf. Sci. 273, 247 (2013).
  34. Tip-induced artifacts in magnetic force microscopy images
    Óscar Iglesias-Freire, Jeffrey R. Bates, Yoichi Miyahara, Agustina Asenjo, and Peter H. Grütter
    Appl. Phys. Lett. 102, 022417 (2013).
  35. Layer-by-layer growth of sodium chloride overlayers on an Fe(001)-p(1 × 1)O surface.
    Antoni Tekiel, Jessica Topple, Yoichi Miyahara, Peter Grütter
    Nanotechnology 50, 505602 (2012).
  36. Conductivity of an atomically defined metallic interface.
    D. J. Oliver, J. Maassen, M. El Ouali, W. Paul, T. Hagedorn, Y. Miyahara, Y. Qi, H. Guo, and P. Grütter
    PNAS 109, 19097 (2012).
  37. Implementation of atomically defined field ion microscopy tips in scanning probe microscopy
    William Paul, Yoichi Miyahara, and Peter Grütter
    Nanotechnology 23, 335702 (2012).
  38. Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments
    Aleksander Labuda, Kei Kobayashi, Yoichi Miyahara, and Peter Grütter
    Rev. Sci. Instrum. 83, 053703 (2012).
  39. Excited-state spectroscopy on an individual quantum dot using atomic force microscopy
    Lynda Cockins, Yoichi Miyahara, SD Bennett, and Aashish Clerk
    Nano Lett. 12, 709 (2012).
  40. Stochastic noise in atomic force microscopy
    Aleksander Labuda, Martin Lysy, William Paul, Yoichi Miyahara, Peter Grütter, Roland Bennewitz, and Mark Sutton
    Phys. Rev. E 86, 031104 (2012).
  41. Field deposition from metallic tips onto insulating substrates
    S. Fostner, A. Tekiel, J. M. Topple, Y. Miyahara, and P. Grütter
    Nanotechnology 22, 465301 (2011).
  42. Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope.
    Till Hagedorn, Mehdi El Ouali, William Paul, David Oliver, Yoichi Miyahara, and Peter Grutter
    Rev. Sci. Instrum. 82, 113903 (2011).
  43. Decoupling conservative and dissipative forces in frequency modulation atomic force microscopy
    Aleksander Labuda, Yoichi Miyahara, Lynda Cockins, and Peter H Grütter
    Phys. Rev. B 84, 125433 (2011).
  44. Noise in combined optical microscopy and dynamic force spectroscopy: Toward in vivo hydration measurements
    J. M. LeDue, M. Lopez-Ayon, Y. Miyahara, S. A. Burke, and P. Grütter
    J. Vac. Sci. Technol. B 28, C4C15 (2010).
  45. Strong Electromechanical Coupling of an Atomic Force Microscope Cantilever to a Quantum Dot.
    Steven D. Bennett, Lynda Cockins, Yoichi Miyahara, Peter Grütter, and Aashish A. Clerk
    Phys. Rev. Lett. 104,  017203 (2010).
  46. Low temperature electrostatic force microscopy of a deep two-dimensional electron gas using a quartz tuning fork
    J. A. Hedberg, A. Lal, Y. Miyahara, P. Grütter, G. Gervais, M. Hilke, L. Pfeiffer, and K. W. West
    Appl. Phys. Lett. 97, 143107 (2010).
  47. Cantilever-based sensing: the origin of surface stress and optimization strategies
    Michel Godin, Vincent Tabard-Cossa, Yoichi Miyahara, Tanya Monga, P J Williams, L Y Beaulieu, R Bruce Lennox, and Peter Grutter
    Nanotechnology, 21, 75501 (2010).
  48. Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy
    Lynda Cockins, Yoichi Miyahara, Steven D. Bennett, Aashish A. Clerk, Sergei Studenikin, Philip Poole, Andrew Sachrajda, and Peter Grutter
    PNAS 107, 9496-9501 (2010).
  49. Spatially resolved low-frequency noise measured by atomic force microscopy
    Lynda Cockins, Yoichi Miyahara, and Peter Grutter.
    Phys. Rev. B 79, 21309 (2009).
  50. Determination of the local contact potential difference of PTCDA on NaCl: a comparison of techniques
    S A Burke, J M LeDue, Y Miyahara, J M Topple, S Fostner, and P Grutter
    Nanotechnology 20, 264012 (2009).
  51. High Q optical fiber tips for NC-AFM in liquid
    JM LeDue, M Lopez-Ayon, SA Burke, and Y. Miyahara, Peter Grutter
    Nanotechnology 20, 264018 (2009).
  52. High-aspect ratio metal tips attached to atomic force microscopy cantilevers with controlled angle, length, and radius for electrostatic force microscopy
    Lynda Cockins, Yoichi Miyahara, Romain Stomp, and Peter Grutter
    Rev. Sci. Instrum. 78, 113706 (2007).
  53. Use of an electron-beam evaporator for the creation of nanostructured pits in an insulating surface
    Jeffrey M. Mativetsky, Yoichi Miyahara, Shawn Fostner, Sarah A. Burke, and Peter Grutter
    Appl. Phys. Lett. 88, 233121 (2006).
  54. Controlled deposition of gold nanodots using non-contact atomic force microscopy
    M E Pumarol, Y Miyahara, R Gagnon, and P Grutter
    Nanotechnology 16, 1083 (2005).
  55. From tunneling to point contact: Correlation between forces and current
    Yan Sun, Henrik Mortensen, Sacha Schär, Anne-Sophie Lucier, Yoichi Miyahara, Peter Grütter, and Werner Hofer
    Phys. Rev. B 71, 193407 (2005).
  56. Detection of Single-Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic-Force Microscopy
    Romain Stomp, Yoichi Miyahara, Sacha Schaer, Qingfeng Sun, Hong Guo, Peter Grutter, Sergei Studenikin, Philip Poole, and Andy Sachrajda
    Phys. Rev. Lett. 94, 56802 (2005).
  57. A tunneling spectroscopy study of the temperature dependence of the forbidden band in Bi2Te3 and Sb2Te3.
    V. A. Kul’bachinskii, H Ozaki, Y Miyahara, and K Funagai
    J. Exp. Theor. Phys. 97, 1212  (2003).
  58. Non-contact atomic force microscope with a PZT cantilever used for deflection sensing, direct oscillation and feedback actuation
    Y Miyahara, M Deschler, T Fujii, S Watanabe, and H Bleuler
    Appl. Surf. Sci. 188, 450 (2002).
  59. Scanning tunnelling microscopy study of the charge-density wave in Hf-doped 1T-TaS2
    H Bando, K Koizumi, Y Miyahara, and H Ozaki
    J. Phys. Condensed Matt. 12, 4353 (2000).
  60. Lead zirconate titanate cantilever for noncontact atomic force microscopy.
    Y Miyahara, T Fujii, S Watanabe, A Tonoli, S Carabelli, H Yamada, and H Bleuler
    Appl. Surf. Sci. 140, 428 (1999).
  61. Single crystal growth of (LaO)CuS
    Y Takano, C Ogawa, Y Miyahara, H Ozaki, and K Sekizawa
    J. Alloys and Compd. 249, 221 (1997).
  62. Scanning tunneling microscopy investigations of single-q charge density wave state in hafnium-doped tantalum disulfide
    H Bando, Y Miyahara, H Enomoto, and H Ozaki
    Surf. Sci. 381, L609 (1997).
  63. Tunneling study of the valence band structure of Pb1-xEuxTe.
    T Syoji, Y Miyahara, and H Ozaki
    Jpn. J. Appl. Phys. 35, L471 (1996).
  64. Tunnelling spectroscopy investigation of the CDW state in TiSe2-xSx
    Y Miyahara, H Bando, and H Ozaki
    J. Phys. Condensed Matt. 8, 7453 (1996).
  65. Tunnelling spectroscopic study of the CDW energy gap in TiSe2
    Y Miyahara, H Bando, and H Ozaki
    J. Phys. Condensed Matt. 7, 2553 (1995).

Book Chapter

      1. Dissipation modulated Kelvin probe force microscopy method
        Yoichi Miyahara and Peter Grütter
        in Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization  (Springer-Verlag Berlin Heidelberg 2018).
      2. Electrical characterization of low dimensional systems (quantum/nano-structures)
        Yoichi Miyahara, Lynda Cockins, and Peter Grütter
        in Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer-Verlag Berlin Heidelberg 2012).

Recent Conference Presentations

  1. Mayorga-Luna, R., Austin-Bingamon, N., D.C., B., Runsewe, D., Ford, M., Betancourt, T., Miyahara, Y., “Charge Transfer Through Individual DNA Molecules Measured by Mechanically Detected Electric Charge Sensing,” 2023 MRS Spring Meeting & Exhibit,  Material Research Society, San Francisco, CA, United States. (April 10, 2023).
  2. Yoichi Miyahara, Binod DC, Noah Austin-Bingamon, “Cryogenic atomic force microscopy system integrated in cryogen-free dilution refrigerator for single-electron sensitive electric force microscopy/spectroscopy,” APS March Meeting,  American Physics Society,
    Las Vegas, NV, United States. (March 10, 2023).
  3. Dong Seob Kim, Rigo Mayorga-Luna, Dingyi Ye, Tixuan Tan, Yue Ni, Zhida Liu, Roy Dominguez, Mitchell Ford, Frank Gao, Saba Arash, Kenji Watanabe, Takashi Taniguchi, Suenne Kim, Chih-Kang Shih, Keji Lai, Wang Yao, Li Yang, Xiaoqin Elaine Li, Yoichi Miyahara,  “Electrostatic Potential of hBN Moiré Superlattices,” APS March Meeting, American Physics Society, Las Vegas, NV, United States. (March 10, 2023).
  4. Binod DC, Noah Austin-Bingamon, Yoichi Miyahara,  “Characterization of Pt quantum dots fabricated by electron-beam induced deposition,” APS March Meeting, American Physics Society, Las Vegas, NV, United States. (March 9, 2023).
  5. Noah Austin-Bingamon, Binod DC, Yoichi Miyahara, “Frequency and damping noise of atomic force microscopy cantilevers with optomechanically modified quality factor at low temperature,” APS March Meeting,  American Physics Society, Las Vegas, NV, United States. (March 7, 2023).

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